Vectorial scanning force microscopy using a nanowire sensor

ABSTRACT Self-assembled nanowire (NW) crystals can be grown into nearly defect-free nanomechanical resonators with exceptional properties, including small motional mass, high resonant

frequency and low dissipation. Furthermore, by virtue of slight asymmetries in geometry, a NW's flexural modes are split into doublets oscillating along orthogonal axes. These

characteristics make bottom-up grown NWs extremely sensitive vectorial force sensors. Here, taking advantage of its adaptability as a scanning probe, we use a single NW to image a sample

surface. By monitoring the frequency shift and direction of oscillation of both modes as we scan above the surface, we construct a map of all spatial tip–sample force derivatives in the

plane. Finally, we use the NW to image electric force fields distinguishing between forces arising from the NW charge and polarizability. This universally applicable technique enables a form

of atomic force microscopy particularly suited to mapping the size and direction of weak tip–sample forces. Access through your institution Buy or subscribe This is a preview of

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ADDITIONAL ACCESS OPTIONS: * Log in * Learn about institutional subscriptions * Read our FAQs * Contact customer support SIMILAR CONTENT BEING VIEWED BY OTHERS COUPLED MECHANICAL OSCILLATOR

ENABLES PRECISE DETECTION OF NANOWIRE FLEXURAL VIBRATIONS Article Open access 05 December 2023 BINARY-STATE SCANNING PROBE MICROSCOPY FOR PARALLEL IMAGING Article Open access 17 March 2022

ULTRASENSITIVE NANO-OPTOMECHANICAL FORCE SENSOR OPERATED AT DILUTION TEMPERATURES Article Open access 05 July 2021 REFERENCES * Binnig, G., Quate, C. F. & Gerber, C. Atomic force

microscope. _Phys. Rev. Lett._ 56, 930–933 (1986). Article  CAS  Google Scholar  * Giessibl, F. J. Advances in atomic force microscopy. _Rev. Mod. Phys._ 75, 949–983 (2003). Article  CAS 

Google Scholar  * Giessibl, F. J. Atomic resolution of the silicon (111)-(7×7) surface by atomic force microscopy. _Science_ 267, 68–71 (1995). Article  CAS  Google Scholar  * Giessibl, F.

J., Hembacher, S., Bielefeldt, H. & Mannhart, J. Subatomic features on the silicon (111)-(7×7) surface observed by atomic force microscopy. _Science_ 289, 422–425 (2000). Article  CAS 

Google Scholar  * Poggio, M. Sensing from the bottom up. _Nat. Nanotech._ 8, 482–483 (2013). Article  CAS  Google Scholar  * Sazonova, V. et al. A tunable carbon nanotube electromechanical

oscillator. _Nature_ 431, 284–287 (2004). Article  CAS  Google Scholar  * Bunch, J. S. et al. Electromechanical resonators from graphene sheets. _Science_ 315, 490–493 (2007). Article  CAS 

Google Scholar  * Perisanu, S. et al. High _Q_ factor for mechanical resonances of batch-fabricated SiC nanowires. _Appl. Phys. Lett._ 90, 043113 (2007). Article  Google Scholar  * Feng, X.

L., He, R., Yang, P. & Roukes, M. L. Very high frequency silicon nanowire electromechanical resonators. _Nano Lett._ 7, 1953–1959 (2007). Article  CAS  Google Scholar  * Nichol, J. M.,

Hemesath, E. R., Lauhon, L. J. & Budakian, R. Displacement detection of silicon nanowires by polarization-enhanced fiber-optic interferometry. _Appl. Phys. Lett._ 93, 193110 (2008).

Article  Google Scholar  * Li, M. et al. Bottom-up assembly of large-area nanowire resonator arrays. _Nat. Nanotech._ 3, 88–92 (2008). Article  CAS  Google Scholar  * Belov, M. et al.

Mechanical resonance of clamped silicon nanowires measured by optical interferometry. _J. Appl. Phys._ 103, 074304 (2008). Article  Google Scholar  * Gil-Santos, E. et al. Nanomechanical

mass sensing and stiffness spectrometry based on two-dimensional vibrations of resonant nanowires. _Nat. Nanotech._ 5, 641–645 (2010). Article  CAS  Google Scholar  * Chaste, J. et al. A

nanomechanical mass sensor with yoctogram resolution. _Nat. Nanotech._ 7, 301–304 (2012). Article  CAS  Google Scholar  * Moser, J. et al. Ultrasensitive force detection with a nanotube

mechanical resonator. _Nat. Nanotech._ 8, 493–496 (2013). Article  CAS  Google Scholar  * Moser, J., Eichler, A., Güttinger, J., Dykman, M. I. & Bachtold, A. Nanotube mechanical

resonators with quality factors of up to 5 million. _Nat. Nanotech._ 9, 1007–1011 (2014). Article  CAS  Google Scholar  * Gysin, U., Rast, S., Kisiel, M., Werle, C. & Meyer, E. Low

temperature ultrahigh vacuum noncontact atomic force microscope in the pendulum geometry. _Rev. Sci. Instrum_. 82, 023705 (2011). Article  CAS  Google Scholar  * Nichol, J. M., Hemesath, E.

R., Lauhon, L. J. & Budakian, R. Nanomechanical detection of nuclear magnetic resonance using a silicon nanowire oscillator. _Phys. Rev. B_ 85, 054414 (2012). Article  Google Scholar  *

Nichol, J. M., Naibert, T. R., Hemesath, E. R., Lauhon, L. J. & Budakian, R. Nanoscale fourier-transform magnetic resonance imaging. _Phys. Rev. X_ 3, 031016 (2013). Google Scholar  *

Nonnenmacher, M., O'Boyle, M. P. & Wickramasinghe, H. K. Kelvin probe force microscopy. _Appl. Phys. Lett._ 58, 2921–2923 (1991). Article  Google Scholar  * Stipe, B. C., Mamin, H.

J., Stowe, T. D., Kenny, T. W. & Rugar, D. Noncontact friction and force fluctuations between closely spaced bodies. _Phys. Rev. Lett._ 87, 096801 (2001). Article  CAS  Google Scholar  *

Gloppe, A. et al. Bidimensional nano-optomechanics and topological backaction in a non-conservative radiation force field. _Nat. Nanotech._ 9, 920–926 (2014). Article  CAS  Google Scholar 

* Pfeiffer, O., Bennewitz, R., Baratoff, A., Meyer, E. & Grütter, P. Lateral-force measurements in dynamic force microscopy. _Phys. Rev. B_ 65, 161403 (2002). Article  Google Scholar  *

Giessibl, F. J., Herz, M. & Mannhart, J. Friction traced to the single atom. _Proc. Natl Acad. Sci. USA_ 99, 12006–12010 (2002). Article  CAS  Google Scholar  * Kawai, S., Kitamura,

S.-I., Kobayashi, D. & Kawakatsu, H. Dynamic lateral force microscopy with true atomic resolution. _Appl. Phys. Lett._ 87, 173105 (2005). Article  Google Scholar  * Kawai, S., Sasaki, N.

& Kawakatsu, H. Direct mapping of the lateral force gradient on Si (111)-(7×7). _Phys. Rev. B_ 79, 195412 (2009). Article  Google Scholar  * Kawai, S. et al. Ultrasensitive detection of

lateral atomic-scale interactions on graphite (0001) via bimodal dynamic force measurements. _Phys. Rev. B_ 81, 085420 (2010). Article  Google Scholar  * Cadeddu, D. et al. Time-resolved

nonlinear coupling between orthogonal flexural modes of a pristine GaAs nanowire. _Nano Lett._ 16, 926–931 (2016). Article  CAS  Google Scholar  * Karabacak, D., Kouh, T., Huang, C. C. &

Ekinci, K. L. Optical knife-edge technique for nanomechanical displacement detection. _Appl. Phys. Lett._ 88, 193122 (2006). Article  Google Scholar  * Faust, T. et al. Nonadiabatic

dynamics of two strongly coupled nanomechanical resonator modes. _Phys. Rev. Lett_. 109, 037205 (2012). Article  Google Scholar  * Kuehn, S., Loring, R. F. & Marohn, J. A. Dielectric

fluctuations and the origins of noncontact friction. _Phys. Rev. Lett._ 96, 156103 (2006). Article  Google Scholar  * Rieger, J., Faust, T., Seitner, M. J., Kotthaus, J. P. & Weig, E. M.

Frequency and Q factor control of nanomechanical resonators. _Appl. Phys. Lett._ 101, 103110 (2012). Article  Google Scholar  * Stern, J. E., Terris, B. D., Mamin, H. J. & Rugar, D.

Deposition and imaging of localized charge on insulator surfaces using a force microscope. _Appl. Phys. Lett._ 53, 2717–2719 (1988). Article  Google Scholar  * Schönenberger, C. &

Alvarado, S. F. Observation of single charge carriers by force microscopy. _Phys. Rev. Lett._ 65, 3162–3164 (1990). Article  Google Scholar  * Sanii, B. & Ashby, P. D. High sensitivity

deflection detection of nanowires. _Phys. Rev. Lett._ 104, 147203 (2010). Article  Google Scholar  * Uccelli, E. et al. Three-dimensional multiple-order twinning of self-catalyzed GaAs

nanowires on Si substrates. _Nano Lett._ 11, 3827–3832 (2011). Article  CAS  Google Scholar  * Russo-Averchi, E. et al. Suppression of three dimensional twinning for a 100% yield of vertical

GaAs nanowires on silicon. _Nanoscale_ 4, 1486–1490 (2012). Article  CAS  Google Scholar  * Heigoldt, M. et al. Long range epitaxial growth of prismatic heterostructures on the facets of

catalyst-free GaAs nanowires. _J. Mater. Chem._ 19, 840–848 (2009). Article  CAS  Google Scholar  * Rugar, D., Mamin, H. J. & Guethner, P. Improved fiber-optic interferometer for atomic

force microscopy. _Appl. Phys. Lett._ 55, 2588–2590 (1989). Article  CAS  Google Scholar  Download references ACKNOWLEDGEMENTS We thank S. Martin and the mechanical workshop at the

University of Basel Physics Department for help in designing and building the NW microscope and J. Teissier for useful discussions. We acknowledge the support of the ERC through Starting

Grants NWScan (Grant No. 334767) and UpCon (Grant No. 239743), the Swiss Nanoscience Institute (Project P1207), the Swiss National Science Foundation (Ambizione Grant No. PZ00P2-161284/1 and

Project Grant No. 200020-159893) and the NCCR Quantum Science and Technology (QSIT). AUTHOR INFORMATION AUTHORS AND AFFILIATIONS * Department of Physics, University of Basel,

Klingelbergstrasse 82, Basel, 4056, Switzerland Nicola Rossi, Floris R. Braakman, Davide Cadeddu, Denis Vasyukov & Martino Poggio * Laboratoire des Matériaux Semiconducteurs, Institut

des Matériaux, École Polytechnique Fédérale de Lausanne, Lausanne, 1015, Switzerland Gözde Tütüncüoglu & Anna Fontcuberta i Morral Authors * Nicola Rossi View author publications You can

also search for this author inPubMed Google Scholar * Floris R. Braakman View author publications You can also search for this author inPubMed Google Scholar * Davide Cadeddu View author

publications You can also search for this author inPubMed Google Scholar * Denis Vasyukov View author publications You can also search for this author inPubMed Google Scholar * Gözde

Tütüncüoglu View author publications You can also search for this author inPubMed Google Scholar * Anna Fontcuberta i Morral View author publications You can also search for this author

inPubMed Google Scholar * Martino Poggio View author publications You can also search for this author inPubMed Google Scholar CONTRIBUTIONS N.R. and F.R.B. performed the experiment, G.T. and

A.F.i.M. grew the nanowires, D.V., N.R., D.C. and M.P. designed and constructed the measurement set-up. N.R. fabricated the sample. N.R. and F.R.B. undertook the data analysis. N.R.,

F.R.B., and M.P. contributed to the interpretation of the data and wrote the manuscript. All authors commented and contributed to the manuscript. M.P. conceived and supervised the project.

CORRESPONDING AUTHOR Correspondence to Martino Poggio. ETHICS DECLARATIONS COMPETING INTERESTS The authors declare no competing financial interests. SUPPLEMENTARY INFORMATION SUPPLEMENTARY

INFORMATION Supplementary information (PDF 305 kb) RIGHTS AND PERMISSIONS Reprints and permissions ABOUT THIS ARTICLE CITE THIS ARTICLE Rossi, N., Braakman, F., Cadeddu, D. _et al._

Vectorial scanning force microscopy using a nanowire sensor. _Nature Nanotech_ 12, 150–155 (2017). https://doi.org/10.1038/nnano.2016.189 Download citation * Received: 01 April 2016 *

Accepted: 24 August 2016 * Published: 17 October 2016 * Issue Date: February 2017 * DOI: https://doi.org/10.1038/nnano.2016.189 SHARE THIS ARTICLE Anyone you share the following link with

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